conference

Discovering Most Classificatory Patterns for Very Expressive Pattern Classes.

Masayuki Takeda, Shunsuke Inenaga, Hideo Bannai, Ayumi Shinohara, Setsuo Arikawa

Discovery Science, Lecture Notes in Computer Science Vol.2843, pp.486-493 (2003), [peer-reviewed]

Abstract / 概要

The classificatory power of a pattern is measured by how well it separates two given sets of strings. This paper gives practical algorithms to find the fixed/variable-length-don’t-care pattern (FVLDC pattern) and approximate FVLDC pattern which are most…